Highly-Sensitive Refractive Index Sensing by Near-infrared Metatronic Nanocircuits.

Rashed, A R; Gudulluoglu, B; Yun, H W; Habib, M; Boyaci, I H; Hong, S H; Ozbay, E; Caglayan, H

Rashed, A R; Gudulluoglu, B; Yun, H W; Habib, M; Boyaci, I H; Hong, S H; Ozbay, E; Caglayan, H.

Afiliación

Rashed AR; Laboratory of Photonics, Tampere University of Technology, 33720, Tampere, Finland. alireza.rashed@tut.fi.
Gudulluoglu B; Nanotechnology Research Center, Bilkent University, Bilkent, 06800, Ankara, Turkey. alireza.rashed@tut.fi.
Yun HW; Nanotechnology Research Center, Bilkent University, Bilkent, 06800, Ankara, Turkey.
Habib M; Hacettepe University, Nanoscience and Nanomedicine Department, 06800, Ankara, Turkey.
Boyaci IH; Components & Materials Research Laboratory, Electronics and Telecommunication Research Institute (ETRI), Daejeon, 305-350, Republic of Korea.
Hong SH; Nanotechnology Research Center, Bilkent University, Bilkent, 06800, Ankara, Turkey.
Ozbay E; Hacettepe University, Food Engineering, 06800, Ankara, Turkey.
Caglayan H; Components & Materials Research Laboratory, Electronics and Telecommunication Research Institute (ETRI), Daejeon, 305-350, Republic of Korea.

Sci Rep ; 8(1): 11457, 2018 07 30.

Article en En | MEDLINE | ID: mdl-30061578

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: Sci Rep Año: 2018 Tipo del documento: Article País de afiliación: Finlandia Pais de publicación: Reino Unido

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