Atomic-scale visualization of oxide thin-film surfaces.

Iwaya, Katsuya; Ohsawa, Takeo; Shimizu, Ryota; Okada, Yoshinori; Hitosugi, Taro

Iwaya, Katsuya; Ohsawa, Takeo; Shimizu, Ryota; Okada, Yoshinori; Hitosugi, Taro.

Afiliación

Iwaya K; Advanced Institute for Materials Research (AIMR), Tohoku University, Sendai, Japan.
Ohsawa T; Center for Emergent Matter Science, RIKEN, Saitama, Japan.
Shimizu R; Advanced Institute for Materials Research (AIMR), Tohoku University, Sendai, Japan.
Okada Y; National Institute for Materials Research, Ibaraki, Japan.
Hitosugi T; Advanced Institute for Materials Research (AIMR), Tohoku University, Sendai, Japan.

Sci Technol Adv Mater ; 19(1): 282-290, 2018.

Article en En | MEDLINE | ID: mdl-29707068

Palabras clave

10 Engineering and Structural materials; 105 Low-Dimension (1D/2D) materials; 201 Electronics / Semiconductor / TCOs; 205 Catalyst / Photocatalyst / Photosynthesis; 212 Surface and interfaces; 306 Thin film / Coatings; Oxide thin films; pulsed laser deposition; scanning tunneling microscopy

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Sci Technol Adv Mater Año: 2018 Tipo del documento: Article País de afiliación: Japón Pais de publicación: Estados Unidos

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