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Comparison of SVM, RF and ELM on an Electronic Nose for the Intelligent Evaluation of Paraffin Samples.
Men, Hong; Fu, Songlin; Yang, Jialin; Cheng, Meiqi; Shi, Yan; Liu, Jingjing.
Afiliación
  • Men H; School of Automation Engineering, Northeast Electric Power University, Jilin 132012, China. menhong@neepu.edu.cn.
  • Fu S; School of Automation Engineering, Northeast Electric Power University, Jilin 132012, China. 2201500474@neepu.edu.cn.
  • Yang J; School of Automation Engineering, Northeast Electric Power University, Jilin 132012, China. 2201400444@neepu.edu.cn.
  • Cheng M; School of Automation Engineering, Northeast Electric Power University, Jilin 132012, China. 2201600376@neepu.edu.cn.
  • Shi Y; School of Automation Engineering, Northeast Electric Power University, Jilin 132012, China. 2201500430@neepu.edu.cn.
  • Liu J; School of Automation Engineering, Northeast Electric Power University, Jilin 132012, China. jingjing_liu@neepu.edu.cn.
Sensors (Basel) ; 18(1)2018 Jan 18.
Article en En | MEDLINE | ID: mdl-29346328

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Sensors (Basel) Año: 2018 Tipo del documento: Article País de afiliación: China Pais de publicación: Suiza

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Sensors (Basel) Año: 2018 Tipo del documento: Article País de afiliación: China Pais de publicación: Suiza