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Atomic Layer Deposition of Lithium Niobium Oxides as Potential Solid-State Electrolytes for Lithium-Ion Batteries.
Wang, Biqiong; Zhao, Yang; Banis, Mohammad Norouzi; Sun, Qian; Adair, Keegan R; Li, Ruying; Sham, Tsun-Kong; Sun, Xueliang.
Afiliación
  • Wang B; Department of Mechanical and Materials Engineering, University of Western Ontario , London, Ontario N6A 5B9, Canada.
  • Zhao Y; Department of Chemistry, University of Western Ontario , London, Ontario N6A 5B7, Canada.
  • Banis MN; Department of Mechanical and Materials Engineering, University of Western Ontario , London, Ontario N6A 5B9, Canada.
  • Sun Q; Department of Mechanical and Materials Engineering, University of Western Ontario , London, Ontario N6A 5B9, Canada.
  • Adair KR; Department of Mechanical and Materials Engineering, University of Western Ontario , London, Ontario N6A 5B9, Canada.
  • Li R; Department of Mechanical and Materials Engineering, University of Western Ontario , London, Ontario N6A 5B9, Canada.
  • Sham TK; Department of Mechanical and Materials Engineering, University of Western Ontario , London, Ontario N6A 5B9, Canada.
  • Sun X; Department of Chemistry, University of Western Ontario , London, Ontario N6A 5B7, Canada.
ACS Appl Mater Interfaces ; 10(2): 1654-1661, 2018 Jan 17.
Article en En | MEDLINE | ID: mdl-29219291
The development of solid-state electrolytes by atomic layer deposition (ALD) holds unparalleled advantages toward the fabrication of next-generation solid-state batteries. Lithium niobium oxide (LNO) thin films with well-controlled film thickness and composition were successfully deposited by ALD at a deposition temperature of 235 °C using lithium tert-butoxide and niobium ethoxide as Li and Nb sources, respectively. Furthermore, incorporation of higher Li content was achieved by increasing the Li-to-Nb subcycle ratio. In addition, detailed X-ray absorption near edge structure studies of the amorphous LNO thin films on the Nb L-edge revealed the existence of Nb as Nb5+ in a distorted octahedral structure. The octahedrons in niobium oxide thin films experienced severe distortions, which could be gradually alleviated upon the introduction of Li atoms into the thin films. The ionic conductivities of the as-prepared LNO thin films were also measured, with the highest value achieving 6.39 × 10-8 S cm-1 at 303 K with an activation energy of 0.62 eV.
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Asunto de la revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Año: 2018 Tipo del documento: Article País de afiliación: Canadá Pais de publicación: Estados Unidos
Texto completo
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Asunto de la revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Año: 2018 Tipo del documento: Article País de afiliación: Canadá Pais de publicación: Estados Unidos