1 µs broadband frequency sweeping reflectometry for plasma density and fluctuation profile measurements.
Rev Sci Instrum
; 88(11): 113506, 2017 Nov.
Article
en En
| MEDLINE
| ID: mdl-29195393
Frequency swept reflectometry has reached the symbolic value of 1 µs sweeping time; this performance has been made possible, thanks to an improved control of the ramp voltage driving the frequency source. In parallel, the memory depth of the acquisition system has been upgraded and can provide up to 200 000 signals during a plasma discharge. Additional improvements regarding the trigger delay determination of the acquisition and the voltage ramp linearity required by this ultra-fast technique have been set. While this diagnostic is traditionally dedicated to the plasma electron density profile measurement, such a fast sweeping rate can provide the study of fast plasma events and turbulence with unprecedented time and radial resolution from the edge to the core. Experimental results obtained on ASDEX Upgrade plasmas are presented to demonstrate the performances of the diagnostic.
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1
Colección:
01-internacional
Base de datos:
MEDLINE
Idioma:
En
Revista:
Rev Sci Instrum
Año:
2017
Tipo del documento:
Article
País de afiliación:
Francia
Pais de publicación:
Estados Unidos