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A quantitative method for measuring small residual beam tilts in high-resolution transmission electron microscopy.
Ming, Wenquan; Chen, Jianghua; Allen, Christopher S; Duan, Shiyun; Shen, Ruohan.
Afiliación
  • Ming W; Centre for High Resolution Electron Microscopy, College of Materials Science and Engineering, Hunan University, Changsha, 410082, China.
  • Chen J; Centre for High Resolution Electron Microscopy, College of Materials Science and Engineering, Hunan University, Changsha, 410082, China. Electronic address: jhchen123@hnu.edu.cn.
  • Allen CS; Department of Materials Science, University of Oxford, Parks Road, Oxford, OX1 3PH, UK.
  • Duan S; Centre for High Resolution Electron Microscopy, College of Materials Science and Engineering, Hunan University, Changsha, 410082, China.
  • Shen R; Centre for High Resolution Electron Microscopy, College of Materials Science and Engineering, Hunan University, Changsha, 410082, China.
Ultramicroscopy ; 184(Pt B): 18-28, 2018 01.
Article en En | MEDLINE | ID: mdl-29059563
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2018 Tipo del documento: Article País de afiliación: China Pais de publicación: Países Bajos
Texto completo
Añadir a Mi BVS
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2018 Tipo del documento: Article País de afiliación: China Pais de publicación: Países Bajos