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Origin of atomic displacement in HAADF image of the tilted specimen.
Cui, J; Yao, Y; Wang, Y G; Shen, X; Yu, R C.
Afiliación
  • Cui J; Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China; School of Physical Sciences, University of Chinese Academy of Science, Beijing 100049, China.
  • Yao Y; Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China. Electronic address: yaoyuan@iphy.ac.cn.
  • Wang YG; Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China.
  • Shen X; Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China.
  • Yu RC; Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China; School of Physical Sciences, University of Chinese Academy of Science, Beijing 100049, China.
Ultramicroscopy ; 182: 156-162, 2017 11.
Article en En | MEDLINE | ID: mdl-28689082
The effect of the tilt of the crystallographic orientation with respect to an incident electron probe on high-angle annular dark field (HAADF) imaging in aberration-corrected scanning transmission electron microscopy (STEM) is investigated in experiment and simulation. A small specimen tilt can lead to unequal deviations of different atom species in the HAADF image and result in further relative displacement between anion and cation. Simulated HAADF images also confirm that the crystal tilt causes an artifact in atom polarization. The effect is derived from the scattering abilities of different atoms.
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2017 Tipo del documento: Article País de afiliación: China Pais de publicación: Países Bajos

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2017 Tipo del documento: Article País de afiliación: China Pais de publicación: Países Bajos