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Revealing the Crystalline Integrity of Wafer-Scale Graphene on SiO2/Si: An Azimuthal RHEED Approach.
Lu, Zonghuan; Sun, Xin; Xiang, Yu; Washington, Morris A; Wang, Gwo-Ching; Lu, Toh-Ming.
Afiliación
  • Lu Z; Department of Physics, Applied Physics, and Astronomy, and Center for Materials, Devices, and Integrated Systems, Rensselaer Polytechnic Institute , Troy, New York 12180, United States.
  • Sun X; Department of Physics, Applied Physics, and Astronomy, and Center for Materials, Devices, and Integrated Systems, Rensselaer Polytechnic Institute , Troy, New York 12180, United States.
  • Xiang Y; Department of Physics, Applied Physics, and Astronomy, and Center for Materials, Devices, and Integrated Systems, Rensselaer Polytechnic Institute , Troy, New York 12180, United States.
  • Washington MA; Department of Physics, Applied Physics, and Astronomy, and Center for Materials, Devices, and Integrated Systems, Rensselaer Polytechnic Institute , Troy, New York 12180, United States.
  • Wang GC; Department of Physics, Applied Physics, and Astronomy, and Center for Materials, Devices, and Integrated Systems, Rensselaer Polytechnic Institute , Troy, New York 12180, United States.
  • Lu TM; Department of Physics, Applied Physics, and Astronomy, and Center for Materials, Devices, and Integrated Systems, Rensselaer Polytechnic Institute , Troy, New York 12180, United States.
ACS Appl Mater Interfaces ; 9(27): 23081-23091, 2017 Jul 12.
Article en En | MEDLINE | ID: mdl-28621924
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Asunto de la revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Año: 2017 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Estados Unidos
Texto completo
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Asunto de la revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Año: 2017 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Estados Unidos