SD-SEM: sparse-dense correspondence for 3D reconstruction of microscopic samples.

Baghaie, Ahmadreza; Tafti, Ahmad P; Owen, Heather A; D'Souza, Roshan M; Yu, Zeyun

Baghaie, Ahmadreza; Tafti, Ahmad P; Owen, Heather A; D'Souza, Roshan M; Yu, Zeyun.

Afiliación

Baghaie A; Department of Electrical Engineering, University of Wisconsin-Milwaukee, WI, USA. Electronic address: abaghaie@uwm.edu.
Tafti AP; Biomedical Informatics Research Center, Marshfield Clinic Research Foundation, WI, USA.
Owen HA; Department of Biological Sciences, University of Wisconsin-Milwaukee, WI, USA.
D'Souza RM; Department of Mechanical Engineering, University of Wisconsin-Milwaukee, WI, USA.
Yu Z; Departments of Electrical Engineering and Computer Science, University of Wisconsin-Milwaukee, WI, USA.

Micron ; 97: 41-55, 2017 Jun.

Article en En | MEDLINE | ID: mdl-28343096

Palabras clave

3D reconstruction; Dense correspondence; Feature descriptors; Scanning electron microscope (SEM)

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Micron Asunto de la revista: DIAGNOSTICO POR IMAGEM Año: 2017 Tipo del documento: Article Pais de publicación: Reino Unido

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google