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Electron-beam-induced-current and active secondary-electron voltage-contrast with aberration-corrected electron probes.
Han, Myung-Geun; Garlow, Joseph A; Marshall, Matthew S J; Tiano, Amanda L; Wong, Stanislaus S; Cheong, Sang-Wook; Walker, Frederick J; Ahn, Charles H; Zhu, Yimei.
Afiliación
  • Han MG; Condensed Matter Physics & Materials Science, Brookhaven National Laboratory, Upton, NY 11973, USA. Electronic address: mghan@bnl.gov.
  • Garlow JA; Condensed Matter Physics & Materials Science, Brookhaven National Laboratory, Upton, NY 11973, USA; Materials Science and Engineering Department, Stony Brook University, Stony Brook, NY 11794, USA.
  • Marshall MS; Department of Chemistry, Stony Brook University, Stony Brook, NY 11974, USA.
  • Tiano AL; Department of Chemistry, Stony Brook University, Stony Brook, NY 11974, USA.
  • Wong SS; Condensed Matter Physics & Materials Science, Brookhaven National Laboratory, Upton, NY 11973, USA; Department of Chemistry, Stony Brook University, Stony Brook, NY 11974, USA.
  • Cheong SW; Department of Physics and Astronomy, Rutgers Center for Emergent Materials, Rutgers University, Piscataway, NJ 08854, USA.
  • Walker FJ; Department of Applied Physics and Center for Research on Interface Structures and Phenomena, Yale University, New Haven, CT 06520, USA; Department of Mechanical Engineering and Materials Science, Yale University, New Haven, CT 06520, USA.
  • Ahn CH; Department of Applied Physics and Center for Research on Interface Structures and Phenomena, Yale University, New Haven, CT 06520, USA; Department of Mechanical Engineering and Materials Science, Yale University, New Haven, CT 06520, USA.
  • Zhu Y; Condensed Matter Physics & Materials Science, Brookhaven National Laboratory, Upton, NY 11973, USA.
Ultramicroscopy ; 177: 14-19, 2017 06.
Article en En | MEDLINE | ID: mdl-28193560
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2017 Tipo del documento: Article Pais de publicación: Países Bajos
Texto completo
Añadir a Mi BVS
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2017 Tipo del documento: Article Pais de publicación: Países Bajos