3D elemental mapping with nanometer scale depth resolution via electron optical sectioning.

Pennycook, Timothy J; Yang, Hao; Jones, Lewys; Cabero, Mariona; Rivera-Calzada, Alberto; Leon, Carlos; Varela, Maria; Santamaria, Jacobo; Nellist, Peter D

Pennycook, Timothy J; Yang, Hao; Jones, Lewys; Cabero, Mariona; Rivera-Calzada, Alberto; Leon, Carlos; Varela, Maria; Santamaria, Jacobo; Nellist, Peter D.

Afiliación

Pennycook TJ; EPSRC SuperSTEM Facility, Daresbury Laboratory, Warrington WA4 4AD, UK; Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK. Electronic address: timothy.pennycook@univie.ac.at.
Yang H; Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK.
Jones L; Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK.
Cabero M; Grupo de Fisica de Materiales Complejos, Universidad Complutense, 28040 Madrid, Spain.
Rivera-Calzada A; Grupo de Fisica de Materiales Complejos, Universidad Complutense, 28040 Madrid, Spain.
Leon C; Grupo de Fisica de Materiales Complejos, Universidad Complutense, 28040 Madrid, Spain.
Varela M; Grupo de Fisica de Materiales Complejos, Universidad Complutense, 28040 Madrid, Spain; Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.
Santamaria J; Grupo de Fisica de Materiales Complejos, Universidad Complutense, 28040 Madrid, Spain.
Nellist PD; EPSRC SuperSTEM Facility, Daresbury Laboratory, Warrington WA4 4AD, UK; Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK.

Ultramicroscopy ; 174: 27-34, 2017 03.

Article en En | MEDLINE | ID: mdl-28012372

Palabras clave

EELS; Optical sectioning; STEM

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2017 Tipo del documento: Article Pais de publicación: Países Bajos

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