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Ratchet effect study in Si/SiGe heterostructures in the presence of asymmetrical antidots for different polarizations of microwaves.
Bisotto, Isabelle; Kannan, Ethirajulu S; Portal, Jean-Claude; Brown, Devin; Beck, Thomas J; Krupko, Yuriy; Jalabert, Laurent; Fujita, Hiroyuki; Hoshi, Yusuke; Shiraki, Yasuhiro; Saraya, Takura.
Afiliación
  • Bisotto I; LNCMI, UPR 3228, CNRS-INSA-UJF-UPS, BP166, F-38042 Grenoble cedex 9, France.
  • Kannan ES; LNCMI, UPR 3228, CNRS-INSA-UJF-UPS, BP166, F-38042 Grenoble cedex 9, France; Department of Physics, BITS-Pilani, K K Birla, Goa Campus, Zuarinagar, Goa-403726, India.
  • Portal JC; LNCMI, UPR 3228, CNRS-INSA-UJF-UPS, BP166, F-38042 Grenoble cedex 9, France; Institut Universitaire de France and Institut National des Sciences Appliquées, Toulouse, F-31077 cedex 4, France.
  • Brown D; Microelectronics Research Center, Georgia Institute of Technology, 791 Atlantic Drive NW, Atlanta, Georgia 30322, USA.
  • Beck TJ; Microelectronics Research Center, Georgia Institute of Technology, 791 Atlantic Drive NW, Atlanta, Georgia 30322, USA.
  • Krupko Y; LNCMI, UPR 3228, CNRS-INSA-UJF-UPS, BP166, F-38042 Grenoble cedex 9, France.
  • Jalabert L; LIMMS-CNRS-IIS, Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan.
  • Fujita H; CIRMM-IIS, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan.
  • Hoshi Y; Advanced Research Laboratory, Tokyo City University, 8-15-1 Todoroki, Setagaya-ku, 158-0082 Tokyo, Japan.
  • Shiraki Y; Advanced Research Laboratory, Tokyo City University, 8-15-1 Todoroki, Setagaya-ku, 158-0082 Tokyo, Japan.
  • Saraya T; IIS, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan.
Sci Technol Adv Mater ; 15(4): 045005, 2014 Aug.
Article en En | MEDLINE | ID: mdl-27877706

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Sci Technol Adv Mater Año: 2014 Tipo del documento: Article País de afiliación: Francia Pais de publicación: Estados Unidos

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Sci Technol Adv Mater Año: 2014 Tipo del documento: Article País de afiliación: Francia Pais de publicación: Estados Unidos