Slip Correction Measurements of Certified PSL Nanoparticles Using a Nanometer Differential Mobility Analyzer (Nano-DMA) for Knudsen Number From 0.5 to 83.

Kim, Jung Hyeun; Mulholland, George W; Kukuck, Scott R; Pui, David Y H

Kim, Jung Hyeun; Mulholland, George W; Kukuck, Scott R; Pui, David Y H.

Afiliación

Kim JH; Department of Mechanical Engineering, Particle Technology Lab, University of Minnesota, 111 Church Street, Minneapolis, MN 55455.
Mulholland GW; National Institute of Standards and Technology, Gaithersburg, MD 20899.
Kukuck SR; National Institute of Standards and Technology, Gaithersburg, MD 20899.
Pui DY; Department of Mechanical Engineering, Particle Technology Lab, University of Minnesota, 111 Church Street, Minneapolis, MN 55455.

J Res Natl Inst Stand Technol ; 110(1): 31-54, 2005.

Article en En | MEDLINE | ID: mdl-27308102

Palabras clave

Knudsen number; NMDA; electrospray; polystyrene latex particles; slip correction factor

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: J Res Natl Inst Stand Technol Año: 2005 Tipo del documento: Article Pais de publicación: Estados Unidos

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