Intensity Weighted Subtraction Microscopy Approach for Image Contrast and Resolution Enhancement.

Korobchevskaya, Kseniya; Peres, Chiara; Li, Zhibin; Antipov, Alexei; Sheppard, Colin J R; Diaspro, Alberto; Bianchini, Paolo

Korobchevskaya, Kseniya; Peres, Chiara; Li, Zhibin; Antipov, Alexei; Sheppard, Colin J R; Diaspro, Alberto; Bianchini, Paolo.

Afiliación

Korobchevskaya K; Nanoscopy, Nanophysics, Istituto Italiano di Tecnologia, Via Morego 30, 16163 Genova, Italy.
Peres C; Nanoscopy, Nanophysics, Istituto Italiano di Tecnologia, Via Morego 30, 16163 Genova, Italy.
Li Z; Advanced Robotics, Istituto Italiano di Tecnologia, Via Morego 30, 16163 Genova, Italy.
Antipov A; Plasmachem GmbH, Rudower Chaussee, 29, D-12489, Berlin, Germany.
Sheppard CJ; Nanoscopy, Nanophysics, Istituto Italiano di Tecnologia, Via Morego 30, 16163 Genova, Italy.
Diaspro A; Nanoscopy, Nanophysics, Istituto Italiano di Tecnologia, Via Morego 30, 16163 Genova, Italy.
Bianchini P; Nanoscopy, Nanophysics, Istituto Italiano di Tecnologia, Via Morego 30, 16163 Genova, Italy.

Sci Rep ; 6: 25816, 2016 05 12.

Article en En | MEDLINE | ID: mdl-27174367

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Sci Rep Año: 2016 Tipo del documento: Article País de afiliación: Italia Pais de publicación: Reino Unido

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