Direct Determination of 3D Distribution of Elemental Composition in Single Semiconductor Nanoislands by Scanning Auger Microscopy.

Ponomaryov, Semyon S; Yukhymchuk, Volodymyr O; Lytvyn, Peter M; Valakh, Mykhailo Ya

Ponomaryov, Semyon S; Yukhymchuk, Volodymyr O; Lytvyn, Peter M; Valakh, Mykhailo Ya.

Afiliación

Ponomaryov SS; Institute of Semiconductor Physics, NASU, Pr. Nauky 41, Kyiv, 03028, Ukraine. s.s.ponomaryov@gmail.com.
Yukhymchuk VO; Institute of Semiconductor Physics, NASU, Pr. Nauky 41, Kyiv, 03028, Ukraine. yukhym@isp.kiev.ua.
Lytvyn PM; Institute of Semiconductor Physics, NASU, Pr. Nauky 41, Kyiv, 03028, Ukraine. plyt@isp.kiev.ua.
Valakh MY; Institute of Semiconductor Physics, NASU, Pr. Nauky 41, Kyiv, 03028, Ukraine. valakh@isp.kiev.ua.

Nanoscale Res Lett ; 11(1): 103, 2016 Dec.

Article en En | MEDLINE | ID: mdl-26909783

Palabras clave

3D composition distribution; Gigantic interdiffusion; Opened and capped nanostructures; Scanning Auger microscopy; Single quantum dots

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nanoscale Res Lett Año: 2016 Tipo del documento: Article País de afiliación: Ucrania Pais de publicación: Estados Unidos

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google