New approaches to nanoparticle sample fabrication for atom probe tomography.

Felfer, P; Li, T; Eder, K; Galinski, H; Magyar, A P; Bell, D C; Smith, G D W; Kruse, N; Ringer, S P; Cairney, J M

Felfer, P; Li, T; Eder, K; Galinski, H; Magyar, A P; Bell, D C; Smith, G D W; Kruse, N; Ringer, S P; Cairney, J M.

Afiliación

Felfer P; School for Aerospace, Mechanical and Mechatronic Engineering/Australian Centre for Microscopy and Microanalysis, The University of Sydney, NSW 2006, Australia. Electronic address: peter.felfer@sydney.edu.au.
Li T; School for Aerospace, Mechanical and Mechatronic Engineering/Australian Centre for Microscopy and Microanalysis, The University of Sydney, NSW 2006, Australia; Materials Department, The University of Oxford, Oxford, UK.
Eder K; School for Aerospace, Mechanical and Mechatronic Engineering/Australian Centre for Microscopy and Microanalysis, The University of Sydney, NSW 2006, Australia.
Galinski H; School of Engineering and Applied Sciences, Harvard University, Cambridge, MA 02138, USA.
Magyar AP; School of Engineering and Applied Sciences, Harvard University, Cambridge, MA 02138, USA; Center for Nanoscale Systems, Harvard University, Cambridge, MA 02138, USA.
Bell DC; School of Engineering and Applied Sciences, Harvard University, Cambridge, MA 02138, USA; Center for Nanoscale Systems, Harvard University, Cambridge, MA 02138, USA.
Smith GD; Materials Department, The University of Oxford, Oxford, UK.
Kruse N; Chemical Physics of Materials (Catalysis-Tribology), Université Libre de Bruxelles, Campus Plaine, CP 243, 1050 Brussels, Belgium.
Ringer SP; School for Aerospace, Mechanical and Mechatronic Engineering/Australian Centre for Microscopy and Microanalysis, The University of Sydney, NSW 2006, Australia.
Cairney JM; School for Aerospace, Mechanical and Mechatronic Engineering/Australian Centre for Microscopy and Microanalysis, The University of Sydney, NSW 2006, Australia.

Ultramicroscopy ; 159 Pt 2: 413-9, 2015 Dec.

Article en En | MEDLINE | ID: mdl-25980894

Palabras clave

Atom probe tomography; Focussed ion beam; Nanoparticles; Sample preparation

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2015 Tipo del documento: Article Pais de publicación: Países Bajos

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