In situ measurement of low-Z material coating thickness on high Z substrate for tokamaks.

Mueller, D; Roquemore, A L; Jaworski, M; Skinner, C H; Miller, J; Creely, A; Raman, P; Ruzic, D

Mueller, D; Roquemore, A L; Jaworski, M; Skinner, C H; Miller, J; Creely, A; Raman, P; Ruzic, D.

Afiliación

Mueller D; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA.
Roquemore AL; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA.
Jaworski M; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA.
Skinner CH; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA.
Miller J; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA.
Creely A; Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA.
Raman P; Department of Nuclear, Plasma, and Radiological Engineering, Center for Plasma Material Interaction, University of Illinois, Urbana, Illinois 61801, USA.
Ruzic D; Department of Nuclear, Plasma, and Radiological Engineering, Center for Plasma Material Interaction, University of Illinois, Urbana, Illinois 61801, USA.

Rev Sci Instrum ; 85(11): 11E821, 2014 Nov.

Article en En | MEDLINE | ID: mdl-25430386

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Rev Sci Instrum Año: 2014 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Estados Unidos

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