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Soft x-ray intensity profile measurements of electron cyclotron heated plasmas using semiconductor detector arrays in GAMMA 10 tandem mirror.
Minami, R; Imai, T; Kariya, T; Numakura, T; Eguchi, T; Kawarasaki, R; Nakazawa, K; Kato, T; Sato, F; Nanzai, H; Uehara, M; Endo, Y; Ichimura, M.
Afiliación
  • Minami R; Plasma Research Center, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan.
  • Imai T; Plasma Research Center, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan.
  • Kariya T; Plasma Research Center, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan.
  • Numakura T; Plasma Research Center, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan.
  • Eguchi T; Plasma Research Center, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan.
  • Kawarasaki R; Plasma Research Center, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan.
  • Nakazawa K; Plasma Research Center, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan.
  • Kato T; Plasma Research Center, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan.
  • Sato F; Plasma Research Center, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan.
  • Nanzai H; Plasma Research Center, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan.
  • Uehara M; Plasma Research Center, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan.
  • Endo Y; Plasma Research Center, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan.
  • Ichimura M; Plasma Research Center, University of Tsukuba, Tsukuba, Ibaraki 305-8577, Japan.
Rev Sci Instrum ; 85(11): 11D807, 2014 Nov.
Article en En | MEDLINE | ID: mdl-25430220
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Rev Sci Instrum Año: 2014 Tipo del documento: Article País de afiliación: Japón Pais de publicación: Estados Unidos
Texto completo
Añadir a Mi BVS
Imprimir
XML
PubMed Links
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Rev Sci Instrum Año: 2014 Tipo del documento: Article País de afiliación: Japón Pais de publicación: Estados Unidos