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Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loading.
Lambert, P K; Hustedt, C J; Vecchio, K S; Huskins, E L; Casem, D T; Gruner, S M; Tate, M W; Philipp, H T; Woll, A R; Purohit, P; Weiss, J T; Kannan, V; Ramesh, K T; Kenesei, P; Okasinski, J S; Almer, J; Zhao, M; Ananiadis, A G; Hufnagel, T C.
Afiliación
  • Lambert PK; Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland 21218, USA.
  • Hustedt CJ; Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland 21218, USA.
  • Vecchio KS; Department of NanoEngineering, University of California San Diego, La Jolla, California 92093, USA.
  • Huskins EL; Oak Ridge Institute for Science and Education, Oak Ridge, Tennessee 37830, USA.
  • Casem DT; US Army Research Laboratory, Aberdeen Proving Ground, Aberdeen, Maryland 21005, USA.
  • Gruner SM; Department of Physics, Cornell University, Ithaca, New York 14853, USA.
  • Tate MW; Department of Physics, Cornell University, Ithaca, New York 14853, USA.
  • Philipp HT; Department of Physics, Cornell University, Ithaca, New York 14853, USA.
  • Woll AR; Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, New York 14853, USA.
  • Purohit P; Department of Physics, Cornell University, Ithaca, New York 14853, USA.
  • Weiss JT; Department of Physics, Cornell University, Ithaca, New York 14853, USA.
  • Kannan V; Department of Mechanical Engineering, Johns Hopkins University, Baltimore, Maryland 21218, USA.
  • Ramesh KT; Department of Mechanical Engineering, Johns Hopkins University, Baltimore, Maryland 21218, USA.
  • Kenesei P; X-ray Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA.
  • Okasinski JS; X-ray Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA.
  • Almer J; X-ray Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA.
  • Zhao M; Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland 21218, USA.
  • Ananiadis AG; Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland 21218, USA.
  • Hufnagel TC; Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland 21218, USA.
Rev Sci Instrum ; 85(9): 093901, 2014 Sep.
Article en En | MEDLINE | ID: mdl-25273733
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Asunto principal: Difracción de Rayos X / Ensayo de Materiales / Láseres de Semiconductores Idioma: En Revista: Rev Sci Instrum Año: 2014 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Estados Unidos
Texto completo
Añadir a Mi BVS
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Asunto principal: Difracción de Rayos X / Ensayo de Materiales / Láseres de Semiconductores Idioma: En Revista: Rev Sci Instrum Año: 2014 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Estados Unidos