Detection of surface mobility of poly (2, 3, 4, 5, 6-pentafluorostyrene) films by in situ variable-temperature ToF-SIMS and contact angle measurements.
J Colloid Interface Sci
; 431: 180-6, 2014 Oct 01.
Article
en En
| MEDLINE
| ID: mdl-24999012
Poly (2, 3, 4, 5, 6-pentafluorostyrene) (5FPS) was prepared by bulk radical polymerization. The spin-cast films of this polymer were analyzed using time-of-flight secondary ion mass spectrometry (ToF-SIMS) at various temperatures ranging from room temperature to 120°C. Principal component analysis (PCA) of the ToF-SIMS data revealed a transition temperature (T(T)) at which the surface structure of 5FPS was rearranged. A comparison between the results of the PCA of ToF-SIMS spectra obtained on 5FPS and polystyrene (PS) indicate that the pendant groups of 5FPS and PS moved in exactly opposite directions as the temperature increased. More pendant groups of 5FPS and PS migrated from the bulk to the surface and verse versa, respectively, as the temperature increased. These results clearly support the view that the abrupt changes in the normalized principal component 1 value was caused by the surface reorientation of the polymers and not by a change in the ion fragmentation mechanism at temperatures above the T(T). Contact angle measurement, which is another extremely surface sensitive technique, was used to monitor the change in the surface tension as a function of temperature. A clear T(T) was determined by the contact angle measurements. The T(T) values determined by contact angle measurements and ToF-SIMS were very similar.
Texto completo:
1
Colección:
01-internacional
Base de datos:
MEDLINE
Tipo de estudio:
Diagnostic_studies
Idioma:
En
Revista:
J Colloid Interface Sci
Año:
2014
Tipo del documento:
Article
País de afiliación:
Hong Kong
Pais de publicación:
Estados Unidos