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Optical design of the short pulse x-ray imaging and microscopy time-angle correlated diffraction beamline at the Advanced Photon Source.
Reininger, R; Dufresne, E M; Borland, M; Beno, M A; Young, L; Kim, K-J; Evans, P G.
Afiliación
  • Reininger R; Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
Rev Sci Instrum ; 84(5): 053103, 2013 May.
Article en En | MEDLINE | ID: mdl-23742528
The short pulse x-ray imaging and microscopy beamline is one of the two x-ray beamlines that will take full advantage of the short pulse x-ray source in the Advanced Photon Source (APS) upgrade. A horizontally diffracting double crystal monochromator which includes a sagittally focusing second crystal will collect most of the photons generated when the chirped electron beam traverses the undulator. A Kirkpatrick-Baez mirror system after the monochromator will deliver to the sample a beam which has an approximately linear correlation between time and vertical beam angle. The correlation at the sample position has a slope of 0.052 ps/µrad extending over an angular range of 800 µrad for a cavity deflection voltage of 2 MV. The expected time resolution of the whole system is 2.6 ps. The total flux expected at the sample position at 10 keV with a 0.9 eV energy resolution is 5.7 × 10(12) photons/s at a spot having horizontal and vertical full width at half maximum of 33 µm horizontal by 14 µm vertical. This new beamline will enable novel time-dispersed diffraction experiments on small samples using the full repetition rate of the APS.

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Rev Sci Instrum Año: 2013 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Estados Unidos

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Rev Sci Instrum Año: 2013 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Estados Unidos