Two-photon excitation selective plane illumination microscopy (2PE-SPIM) of highly scattering samples: characterization and application.
Opt Express
; 21(5): 5998-6008, 2013 Mar 11.
Article
en En
| MEDLINE
| ID: mdl-23482168
In this work we report the advantages provided by two photon excitation (2PE) implemented in a selective plane illumination microscopy (SPIM) when imaging thick scattering samples. In particular, a detailed analysis of the effects induced on the real light sheet excitation intensity distribution is performed. The comparison between single-photon and two-photon excitation profiles shows the reduction of the scattering effects and sample-induced aberrations provided by 2PE-SPIM. Furthermore, uniformity of the excitation distribution and the consequent improved image contrast is shown when imaging scattering phantom samples in depth by 2PE-SPIM. These results show the advantages of 2PE-SPIM and suggest how this combination can further enhance the SPIM performance. Phantom samples have been designed with optical properties compatible with biological applications of interest.
Texto completo:
1
Colección:
01-internacional
Base de datos:
MEDLINE
Asunto principal:
Dispersión de Radiación
/
Microscopía de Fluorescencia por Excitación Multifotónica
Límite:
Humans
Idioma:
En
Revista:
Opt Express
Asunto de la revista:
OFTALMOLOGIA
Año:
2013
Tipo del documento:
Article
País de afiliación:
Italia
Pais de publicación:
Estados Unidos