Revealing thermal effects in the electronic transport through irradiated atomic metal point contacts.

Kopp, Bastian; Yi, Zhiwei; Benner, Daniel; Xie, Fang-Qing; Obermair, Christian; Schimmel, Thomas; Boneberg, Johannes; Leiderer, Paul; Scheer, Elke

Kopp, Bastian; Yi, Zhiwei; Benner, Daniel; Xie, Fang-Qing; Obermair, Christian; Schimmel, Thomas; Boneberg, Johannes; Leiderer, Paul; Scheer, Elke.

Afiliación

Kopp B; Department of Physics, University of Konstanz, Universitätsstraße 10, 78464 Konstanz, Germany.

Beilstein J Nanotechnol ; 3: 703-11, 2012.

Article en En | MEDLINE | ID: mdl-23213634

Palabras clave

(Helmholtz) double layer; atom transistor; atomic contacts; cyclic voltammogram; electrochemically closed break junction; electronic transport; light-induced signals; temperature-induced changes; thermovoltage

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Beilstein J Nanotechnol Año: 2012 Tipo del documento: Article País de afiliación: Alemania Pais de publicación: Alemania

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