Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system.
Nanotechnology
; 23(47): 475708, 2012 Nov 30.
Article
en En
| MEDLINE
| ID: mdl-23117254
A combined x-ray transmission and scanning force microscope setup (NanoXAS) recently installed at a dedicated beamline of the Swiss Light Source combines complementary experimental techniques to access chemical and physical sample properties with nanometer scale resolution. While scanning force microscopy probes physical properties such as sample topography, local mechanical properties, adhesion, electric and magnetic properties on lateral scales even down to atomic resolution, scanning transmission x-ray microscopy offers direct access to the local chemical composition, electronic structure and magnetization. Here we present three studies which underline the advantages of complementary access to nanoscale properties in prototype thin film samples.
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1
Colección:
01-internacional
Base de datos:
MEDLINE
Idioma:
En
Revista:
Nanotechnology
Año:
2012
Tipo del documento:
Article
País de afiliación:
Suiza
Pais de publicación:
Reino Unido