Analysing surface structures on (Ga, Mn)As by atomic force microscopy.

Piano, S; Rushforth, A W; Edmonds, K W; Campion, R P; Adesso, G; Gallagher, B L

Piano, S; Rushforth, A W; Edmonds, K W; Campion, R P; Adesso, G; Gallagher, B L.

Afiliación

Piano S; School of Physics and Astronomy, University of Nottingham, University Park, Nottingham NG7 2RD, United Kingdom.

J Nanosci Nanotechnol ; 12(9): 7545-9, 2012 Sep.

Article en En | MEDLINE | ID: mdl-23035513

RESUMEN

Using atomic force microscopy, we have studied the surface structures of high quality molecular beam epitaxy grown (Ga, Mn)As compound. Several samples with different thickness and Mn concentration, as well as a few (Ga, Mn)(As, P) samples have been investigated. All these samples have shown the presence of periodic ripples aligned along the [110] direction. From a detailed Fourier analysis we have estimated the period (-50 nm) and the amplitude of these structures.

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Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: J Nanosci Nanotechnol Año: 2012 Tipo del documento: Article País de afiliación: Reino Unido Pais de publicación: Estados Unidos

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