Multiple scattering: the key to unravel the subwavelength world from the far-field pattern of a scattered wave.
Phys Rev E Stat Nonlin Soft Matter Phys
; 73(3 Pt 2): 036619, 2006 Mar.
Article
en En
| MEDLINE
| ID: mdl-16605689
For more than a century the possibility of imaging the structure of a medium with diffracting wave fields has been limited by the tradeoff between resolution and imaging depth. While long wavelengths can penetrate deep into a medium, the resolution limit precludes the possibility of observing subwavelength structures. Near-field microscopy has recently demonstrated that the resolution limit can be overcome by bringing a probing sensor within one wavelength distance from the surface to be imaged. This paper extends the scope of near-field microscopy to the reconstruction of subwavelength structures from measurements performed in the far-field. It is shown that the distortion undergone by a wave field as it travels through an inhomogeneous medium and the subsequent generation of local evanescent fields encode subwavelength information in the far-field due to multiple scattering within the medium. This argument is proved theoretically and supported by a limited view experiment performed with elastic waves in which an image with a resolution better than a third of the wavelength is achieved.
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01-internacional
Base de datos:
MEDLINE
Idioma:
En
Revista:
Phys Rev E Stat Nonlin Soft Matter Phys
Asunto de la revista:
BIOFISICA
/
FISIOLOGIA
Año:
2006
Tipo del documento:
Article
País de afiliación:
Reino Unido
Pais de publicación:
Estados Unidos