Near-field intensity correlations in semicontinuous metal-dielectric films.

Seal, K; Sarychev, A K; Noh, H; Genov, D A; Yamilov, A; Shalaev, V M; Ying, Z C; Cao, H

Seal, K; Sarychev, A K; Noh, H; Genov, D A; Yamilov, A; Shalaev, V M; Ying, Z C; Cao, H.

Afiliación

Seal K; Department of Physics and Astronomy, Northwestern University, Evanston, IL 60208, USA.

Phys Rev Lett ; 94(22): 226101, 2005 Jun 10.

Article en En | MEDLINE | ID: mdl-16090411

RESUMEN

Spatial intensity correlation functions are obtained from near-field scanning optical microscope measurements of semicontinuous metal-dielectric films. The concentration of metal particles on a dielectric surface is varied over a wide range to control the scattering strength. At low and high metal coverages where scattering is weak, the intensity correlation functions exhibit oscillations in the direction of incident light due to excitation of propagating surface waves. In the intermediate regime of metal concentration, the oscillatory behavior is replaced by a monotonic decay as a result of strong scattering and anomalous absorption. Significant differences in the near-field intensity correlations between metallic and dielectric random systems are demonstrated.

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Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Phys Rev Lett Año: 2005 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Estados Unidos

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