Local plasticity of Al thin films as revealed by x-ray microdiffraction.

Spolenak, R; Brown, W L; Tamura, N; MacDowell, A A; Celestre, R S; Padmore, H A; Valek, B; Bravman, J C; Marieb, T; Fujimoto, H; Batterman, B W; Patel, J R

Spolenak, R; Brown, W L; Tamura, N; MacDowell, A A; Celestre, R S; Padmore, H A; Valek, B; Bravman, J C; Marieb, T; Fujimoto, H; Batterman, B W; Patel, J R.

Afiliación

Spolenak R; Agere Systems, Lucent Technologies, Murray Hill, New Jersey 07974, USA. spolenak@mf.mpg.de

Phys Rev Lett ; 90(9): 096102, 2003 Mar 07.

Article en En | MEDLINE | ID: mdl-12689241

RESUMEN

Grain-to-grain interactions dominate the plasticity of Al thin films and establish effective length scales smaller than the grain size. We have measured large strain distributions and their changes under plastic strain in 1.5-microm-thick Al 0.5% Cu films using a 0.8-microm-diameter white x-ray probe at the Advanced Light Source. Strain distributions arise not only from the distribution of grain sizes and orientation, but also from the differences in grain shape and from stress environment. Multiple active glide plane domains have been found within single grains. Large grains behave like multiple smaller grains even before a dislocation substructure can evolve.

Buscar en Google

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Phys Rev Lett Año: 2003 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Estados Unidos

Buscar en Google

Añadir a Mi BVS

Imprimir

XML

PubMed Links