RESUMO
We present a method to determine micro and nano in-plane displacements based on the phase singularities generated by application of directional wavelet transforms to speckle pattern images. The spatial distribution of the obtained phase singularities by the wavelet transform configures a network, which is characterized by two quasi-orthogonal directions. The displacement value is determined by identifying the intersection points of the network before and after the displacement produced by the tested object. The performance of this method is evaluated using simulated speckle patterns and experimental data. The proposed approach is compared with the optical vortex metrology and digital image correlation methods in terms of performance and noise robustness, and the advantages and limitations associated to each method are also discussed.
RESUMO
We evaluate the extension of the exact nonlinear reconstruction technique developed for digital holography to the phase-recovery problems presented by other optical interferometric methods, which use carrier modulation. It is shown that the introduction of an analytic wavelet analysis in the ridge of the cepstrum transformation corresponding to the analyzed interferogram can be closely related to the well-known wavelet analysis of the interferometric intensity. Subsequently, the phase-recovery process is improved. The advantages and limitations of this framework are analyzed and discussed using numerical simulations in singular scalar light fields and in temporal speckle pattern interferometry.