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J Chem Phys ; 135(8): 084108, 2011 Aug 28.
Artigo em Inglês | MEDLINE | ID: mdl-21895160

RESUMO

We develop a simple continuum model for the current voltage characteristics of a material as measured by the conducting atomic force microscopy, including space charge effects. We address the effect of the point contact on the magnitude of the current and on the transition voltages between the different current regimes by comparing these with the corresponding expressions obtained with planar electrodes.

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