RESUMO
Directed placement of solution-based nanomaterials at predefined locations with nanoscale precision limits bottom-up integration in semiconductor process technology. We report a method for electric-field-assisted placement of nanomaterials from solution by means of large-scale graphene layers featuring nanoscale deposition sites. The structured graphene layers are prepared via either transfer or synthesis on standard substrates, and then are removed once nanomaterial deposition is completed, yielding material assemblies with nanoscale resolution that cover surface areas >1 mm2. In order to demonstrate the broad applicability, we have assembled representative zero-dimensional, one-dimensional, and two-dimensional semiconductors at predefined substrate locations and integrated them into nanoelectronic devices. Ultimately, this method opens a route to bottom-up integration of nanomaterials for industry-scale applications.
RESUMO
Analysis of nanoscale liquids, including wetting and flow phenomena, is a scientific challenge with far reaching implications for industrial technologies. We report the conception, development, and application of an integrated platform for the experimental characterization of liquids at the nanometer scale. The platform combines the functionalities of a two-dimensional electronic array of sensor devices with in situ application of highly sensitive optical microspectroscopy and atomic force microscopy. We demonstrate the performance capabilities of the platform with an embodiment based on an array of optically transparent graphene sensors. The application of electronic and optical sensing in the platform allows for differentiating between liquids electronically, for determining a liquid's molecular fingerprint, and for monitoring surface wetting dynamics in real time. In order to explore the platform's sensitivity limits, we record topographies and optical spectra of individual, spatially isolated sessile oil emulsion droplets having volumes of less than ten attoliters. The results demonstrate that integrated measurement functionalities based on two-dimensional materials have the potential to push lab-on-chip based analysis from the microscale to the nanoscale.