RESUMEN

We report the experimental implementation of a new method for generating multiple dynamical optical tweezers, where each one of them is generated with an independent linear polarization state with arbitrary orientation. This also allows an independent simultaneous polarization-rotation control. The laser beam, both for generating multiple traps and polarization control, has been modulated using a single reflective nematic liquid crystal with parallel alignment. We present experimental results of controlled displacement, orientation and rotation of birefringent particles. In addition, a simple method for estimating and canceling out the primary astigmatism present in the system is presented.

Asunto(s)

Biofisica/métodos , Birrefringencia , Holografía/instrumentación , Pinzas Ópticas , Rotación , Algoritmos , ADN/química , Dimerización , Diseño de Equipo , Holografía/métodos , Cristales Líquidos , Óptica y Fotónica/métodos , Tamaño de la Partícula , Estrés Mecánico , Rayos Ultravioleta

RESUMEN

Clustered speckle patterns are a particular type of speckles that appear when a coherently illuminated diffuser is imaged through a multiple aperture pupil mask attached to a lens. The cluster formation is the result of the complex speckle modulations of the multiple interferences produced by the apertures. In this paper, a three-dimensional analytical approach to simulate cluster speckles everywhere after the lens is presented. This approach has the possibility of including multiple aperture masks at the lens and at the diffuser, in contrast to previous works which were also limited to the description of the patterns only at the image plane. This model contributes to the development of tailor made speckle patterns that can be used in diverse optical applications, including those lying in the focus region. The approach is validated under different conditions by comparing experimental results with simulations on a statistical basis. Some aspects of possible uses of these clusters are briefly revised, such as optical trapping, manipulation and metrology.