RESUMEN
Catastrophes of all kinds can be roughly defined as short-duration, large-amplitude events following and followed by long periods of "ripening." Major earthquakes surely belong to the class of "catastrophic" events. Because of the space-time scales involved, an experimental approach is often difficult, not to say impossible, however desirable it could be. Described in this article is a "laboratory" setup that yields data of a type that is amenable to theoretical methods of prediction. Observations are made of a critical slowing down in the noisy signal of a solder wire creeping under constant stress. This effect is shown to be a fair signal of the forthcoming catastrophe in two separate dynamical models. The first is an "abstract" model in which a time-dependent quantity drifts slowly but makes quick jumps from time to time. The second is a realistic physical model for the collective motion of dislocations (the Ananthakrishna set of equations for unstable creep). Hope thus exists that similar changes in the response to noise could forewarn catastrophes in other situations, where such precursor effects should manifest early enough.
Asunto(s)
Desastres , Algoritmos , Terremotos , Elasticidad , Diseño de Equipo , Geografía/métodos , Plomo/química , Modelos Estadísticos , Modelos Teóricos , Movimiento (Física) , Oscilometría/métodos , Física/métodos , Presión , Factores de TiempoRESUMEN
With the advancement in nanotechnology, the ability of positioning/measuring at subnanometer scale has been one of the most critical issues for the nanofabrication industry and researchers using scanning probe microscopy. Commercial nanopositioners have achieved direct measurements at the scale of 0.01 nm with capacitive sensing metrology. However, the commercial sensors have small dynamic ranges (up to only a few hundred micrometers) and are relatively large in size (centimeters in the transverse directions to the motion), which is necessary for healthy signal detections but making it difficult to use on smaller devices. This limits applications in which large materials (on the scale of centimeters or greater) are handled with needs of subnanometer resolutions. What has been done in the past is to combine the fine and coarse translation stages with different dynamic ranges to simultaneously achieve long travel range and high spatial resolution. In this paper, we present a novel capacitive position sensing metrology with ultrawide dynamic range from subnanometer to literally any practically desired length for a translation stage. This sensor will greatly simplify the task and enhance the performance of direct metrology in a hybrid translational stage covering translation tasks from subnanometer to centimeters.