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X-ray diffuse scattering measurements of nucleation dynamics at femtosecond resolution.

Lindenberg, A M; Engemann, S; Gaffney, K J; Sokolowski-Tinten, K; Larsson, J; Hillyard, P B; Reis, D A; Fritz, D M; Arthur, J; Akre, R A; George, M J; Deb, A; Bucksbaum, P H; Hajdu, J; Meyer, D A; Nicoul, M; Blome, C; Tschentscher, Th; Cavalieri, A L; Falcone, R W; Lee, S H; Pahl, R; Rudati, J; Fuoss, P H; Nelson, A J; Krejcik, P; Siddons, D P; Lorazo, P; Hastings, J B.

Phys Rev Lett ; 100(13): 135502, 2008 Apr 04.

Artículo en Inglés | MEDLINE | ID: mdl-18517965

RESUMEN

Femtosecond time-resolved small and wide angle x-ray diffuse scattering techniques are applied to investigate the ultrafast nucleation processes that occur during the ablation process in semiconducting materials. Following intense optical excitation, a transient liquid state of high compressibility characterized by large-amplitude density fluctuations is observed and the buildup of these fluctuations is measured in real time. Small-angle scattering measurements reveal snapshots of the spontaneous nucleation of nanoscale voids within a metastable liquid and support theoretical predictions of the ablation process.

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