RESUMEN
Single-photon avalanche diodes (SPADs) belong to a family of avalanche photodiodes (APDs) with single-photon detection capability that operate above the breakdown voltage (i.e., Geiger mode). Design and technology constraints, such as dark current, photon detection probability, and power dissipation, impose inherent device limitations on avalanche photodiodes. Moreover, after the detection of a photon, SPADs require dead time for avalanche quenching and recharge before they can detect another photon. The reduction in dead time results in higher efficiency for photon detection in high-frequency applications. In this work, an electronic interface, based on the pole-zero compensation technique for reducing dead time, was investigated. A nanosecond pulse generator was designed and fabricated to generate pulses of comparable voltage to an avalanche transistor. The quenching time constant (τq) is not affected by the compensation capacitance variation, while an increase of about 30% in the τq is related to the properties of the specific op-amp used in the design. Conversely, the recovery time was observed to be strongly influenced by the compensation capacitance. Reductions in the recovery time, from 927.3 ns down to 57.6 ns and 9.8 ns, were observed when varying the compensation capacitance in the range of 5-0.1 pF. The experimental results from an SPAD combined with an electronic interface based on an avalanche transistor are in strong accordance, providing similar output pulses to those of an illuminated SPAD.
RESUMEN
This paper presents an eddy current approach for testing, estimating, and classifying CFRP plate sub-surface defects, mainly due to delamination, through specific 2D magnetic induction field amplitude maps. These maps, showing marked fuzziness content, require the development of a procedure based on a fuzzy approach being efficiently classified. Since similar defects produce similar maps, we propose a method based on innovative fuzzy similarity formulations. This procedure can collect maps similar to each other in particular defect classes. In addition, a low-cost analysis system, including the probe, has been implemented in hardware. The developed tool can detect and evaluate the extent of surface defects with the same performance as a hardware tool of higher specifications, and it could be fruitfully employed by airline companies to maintain aircraft in compliance with safety standards.