RESUMEN
A dedicated high-resolution high-throughput X-ray powder diffraction beamline has been constructed at the Advanced Photon Source (APS). In order to achieve the goals of both high resolution and high throughput in a powder instrument, a multi-analyzer detector system is required. The design and performance of the 12-analyzer detector system installed on the powder diffractometer at the 11-BM beamline of APS are presented.
Asunto(s)
Difracción de Rayos X/métodos , Diseño de Equipo/métodos , Difracción de Polvo/métodos , Sincrotrones/instrumentación , Difracción de Rayos X/instrumentaciónRESUMEN
X-ray photon correlation spectroscopy was employed in a surface standing wave geometry in order to resolve the thermally driven in-plane dynamics at both the surface/vacuum (top) and polymer/polymer (bottom) interfaces of a thin polystyrene (PS) film on top of Poly(4-bromo styrene) (PBrS) and supported on a Si substrate. The top vacuum interface shows two relaxation modes: one fast and one slow, while the buried polymer-polymer interface shows a single slow mode. The slow mode of the top interface is similar in magnitude and wave vector dependence to the single mode of the buried interface. The dynamics are consistent with a low-viscosity mixed layer between the PS and PBrS and coupling of the capillary wave fluctuations between this layer and the PS.
RESUMEN
We have used measurements of the absolute intensity of diffuse X-ray scattering to extract the interfacial tension of a buried polymer/polymer interface. Diffuse scattering was excited by an X-ray standing wave whose phase was adjusted to have a high intensity at the polymer/polymer interface and simultaneously a node at the polymer/air interface. This method permits the capillary-wave-induced roughness of the interface, and hence the interfacial tension, to be measured independently of the polymer/polymer interdiffusion.