RESUMEN
We report optical planar waveguide formation in vanadate laser crystals YbVO(4) by oxygen ion implantation at an energy of 3.0 MeV and doses from 5 x 10(13) to 2 x 10(15) ions/cm(2) at room temperature. Positive changes of the ordinary refractive indices occur in the implanted regions, which define a waveguide structure in the near surface. The relationship between refractive index changes and doses is presented. Waveguide modes were measured at wavelengths of 633 and 1539 nm, respectively. The magnified field pattern of the propagation light in the annealed waveguide was captured and studied by an end-coupling method. The refractive index profiles were reconstructed by the reflectivity calculation method.
RESUMEN
ZnO/Mg0.16Zn0.84O (ZnO/MgZnO) films are fabricated on x-cut and z-cut LiNbO3 (LN) substrates by radio-frequency magnetron sputtering. High transparencies are confirmed by a spectrophotometer. X-ray diffraction (XRD) spectra show that all the films are c-axis oriented. The waveguiding properties, as well as the refractive indices and thickness of the films are demonstrated and determined by prism coupling. Both transverse electric (TE) and transverse magnetic (TM) modes are measured at lambda=0.633 mum and 1.539 mum, respectively. The waveguide loss is measured at lambda=0.633 mum with a fiber probe technique. The experimental results show that high optical quality ZnO films can be obtained with MgZnO buffer layers.