RESUMEN
An international round-robin experiment has been conducted to test procedures and methods for the measurement of angle-resolved light scattering. ASTM E2387-05 has been used as the main guide, while the experience gained should also contribute to the new ISO standard of angle-resolved scattering currently under development (ISO/WD 19986:2016). Seven laboratories from Europe and the United States measured the angle-resolved scattering from Al/SiO2-coated substrates, transparent substrates, volume diffusors, quasi-volume diffusors, white calibration standards, and grating samples at laser wavelengths in the UV, VIS, and NIR spectra. Results were sent to Fraunhofer IOF, which coordinated the experiments and analyzed the data, while ESA-ESTEC, as the project donor, defined conditions and parameters. Depending mainly on the sample type, overall good to reasonable agreements were observed, with largest deviations at scattering angles very close to the specular beam. Volume diffusor characterization unexpectedly turned out to be challenging. Not all participants provided measurement uncertainty ranges according to the Guide to the Expression of Uncertainty in Measurement; often, a single general scatterometer-related measurement uncertainty value was stated. Although relative instrument measurement uncertainties close to 1% are sometimes claimed, the comparison results did not support these claims for specular scattering samples as mirrors, substrates, or gratings.
RESUMEN
Light-scattering measurements on rugate coatings made out of mixtures of Si(x)Ta(y)O(z) and Si(x)Hf(y)O(z) were performed. Through successive optimization steps for the substrate roughness and deposition parameters, the overall scattering loss could be reduced by 96% to 3.5 ppm. In order to analyze the relevant scattering mechanisms in such coatings, different theoretical models for scattering from bulk and surface imperfections are compared to measured data. The best accordance between simulated and measured data could be achieved for the theory based on bulk imperfections, while the classical roughness based theory, which is used for conventional multilayer systems, gives reasonable good results.