RESUMEN
A versatile atomic force microscope (AFM), which can be installed in a scanning electron microscope (SEM), is introduced. The flexible design of the instrument enables correlated analysis for different experimental configurations, such as AFM imaging directly after nanoindentation in vacuum. In order to demonstrate the capabilities of the specially designed AFM installed inside a SEM, slip steps emanating around nanoindents in single crystalline brass were examined. This example showcases how the combination of AFM and SEM imaging can be utilized for quantitative dislocation analysis through the measurement of the slip step heights without the hindrance of oxide formation. Finally, an in situ nanoindentation technique is introduced, illustrating the use of AFM imaging during indentation experiments to examine plastic deformation occurring under the indenter tip. The mechanical indentation data are correlated to the SEM and AFM images to estimate the number of dislocations emitted to the surface.
RESUMEN
A stress apparatus is reported which allows us to apply forces up to 300 N to solids perpendicular to the field in a superconducting magnet. This configuration is necessary to study stress dependences of transverse magneto-transport effects and magneto-optical properties in Faraday geometry. The usefulness of the apparatus is demonstrated by Hall effect and transverse magnetoresistance measurements in n-InSb as well as far-infrared cyclotron resonance experiments on n-Ge.