RESUMEN
Droplets that spontaneously penetrate a gap between two hydrophobic surfaces without any external stimulus seems counterintuitive. However, in this work we show that it can be energetically favorable for a droplet to penetrate a gap formed by two hydrophobic or in some cases even superhydrophobic surfaces. For this purpose, we derived an analytical equation to calculate the change in Helmholtz free energy of a droplet penetrating a hydrophobic gap. The derived equation solely depends on the gap width, the droplet volume and the contact angle on the gap walls, and predicts whether a droplet penetrates a hydrophobic gap or not. Additionally, numerical simulations were conducted to provide insights into the gradual change in Helmholtz free energy during the process of penetration and to validate the analytical approach. A series of experiments with a hydrophobic gap having an advancing contact angle of [Formula: see text], a droplet volume of about 10 [Formula: see text]L and different gap widths confirmed the theoretical predictions. Limits and possible deviations between the analytical solution, the simulation and the experiments are presented and discussed.
RESUMEN
An advanced software-controlled focused ion beam (FIB) patterning process for the fabrication of combined atomic force-scanning electrochemical microscopy (AFM-SECM) probes is reported. FIB milling is a standard process in scanning probe microscopy (SPM) for specialized SPM probe fabrication. For AFM-SECM, milling of bifunctional probes usually requires several milling steps. Milling such complex multi-layer/multi-material structures using a single milling routine leads to significantly reduced fabrication times and costs. Based on an advanced patterning routine, a semi-automated FIB milling routine for fabricating combined AFM-SECM probes with high reproducibility is presented with future potential for processing at a wafer level. The fabricated bifunctional probes were electrochemically characterized using cyclic voltammetry, and their performance for AFM-SECM imaging experiments was tested. Different insulation materials (Parylene-C and SixNy) have been evaluated with respect to facilitating the overall milling process, the influence on the electrochemical behavior and the long-term stability of the obtained probes. Furthermore, the influence of material composition and layer sequence to the overall shape and properties of the combined probes were evaluated.
RESUMEN
Atomic force microscopy can be readily combined with complementary instrumental techniques ranging from optical to mass-sensitive methods. This Feature highlights recent advances on hyphenated AFM technology, which enables localized studies and mapping of complementary information at surfaces and interfaces.
RESUMEN
Grating couplers for planar silver halide waveguides were designed and fabricated by using focused ion beam (FIB) milling technology, facilitating coupling of mid-infrared radiation from quantum cascade lasers into thin-film waveguide structures. An optimized rectangular grating structure for an emitted wavelength of 10.4 µm, with a grating constant of 16.4 µm was integrated into a silver halide waveguide substrate via an optimized FIB fabrication procedure. Efficient incoupling and radiation propagation through the waveguide was confirmed by analyzing droplets of acetic acid at different concentrations, deposited at the waveguide surface via evanescent field absorption spectroscopy.