RESUMEN
Achieving diffraction-limited performance in fourth-generation synchrotron radiation sources demands monochromator crystals that can preserve the wavefront across an unprecedented extensive range. There is an urgent need for techniques of absolute crystal diffraction wavefront measurement. At the Beijing Synchrotron Radiation Facility (BSRF), a novel edge scan wavefront metrology technique has been developed. This technique employs a double-edge tracking method, making diffraction-limited level absolute crystal diffraction wavefront measurement a reality. The results demonstrate an equivalent diffraction surface slope error below 70â nrad (corresponding to a wavefront phase error of 4.57% λ) r.m.s. within a nearly 6â mm range for a flat crystal in the crystal surface coordinate. The double-edge structure contributes to exceptional measurement precision for slope error reproducibility, achieving levels below 15â nrad (phase error reproducibility < λ/100) even at a first-generation synchrotron radiation source. Currently, the measurement termed double-edge scan (DES) has already been regarded as a critical feedback mechanism in the fabrication of next-generation crystals.
RESUMEN
Crystal monochromators are indispensable optical components for the majority of beamlines at synchrotron radiation facilities. Channel-cut monochromators are sometimes chosen to filter monochromatic X-ray beams by virtue of their ultrahigh angular stability. Nevertheless, high-accuracy polishing on the inner diffracting surfaces remains challenging, thus hampering their performance in preserving the coherence or wavefront of the photon beam. Herein, a magnetically controlled chemical-mechanical polishing (MC-CMP) approach has been successfully developed for fine polishing of the inner surfaces of channel-cut crystals. This MC-CMP process relieves the constraints of narrow working space dictated by small offset requirements and achieves near-perfect polishing on the surface of the crystals. Using this method, a high-quality surface with roughness of 0.614â nm (root mean square, r.m.s.) is obtained in a channel-cut crystal with 7â mm gap designed for beamlines at the High Energy Photon Source, a fourth-generation synchrotron radiation source under construction. On-line X-ray topography and rocking-curve measurements indicate that the stress residual layer on the crystal surface was removed. Firstly, the measured rocking-curve width is in good agreement with the theoretical value. Secondly, the peak reflectivity is very close to theoretical values. Thirdly, topographic images of the optics after polishing were uniform without any speckle or scratches. Only a nearly 2.5â nm-thick SiO2 layer was observed on the perfect crystalline matrix from high-resolution transmission electron microscopy photographs, indicating that the structure of the bulk material is defect- and dislocation-free. Future development of MC-CMP is promising for fabricating wavefront-preserving and ultra-stable channel-cut monochromators, which are crucial to exploit the merits of fourth-generation synchrotron radiation sources or hard X-ray free-electron lasers.
RESUMEN
Thermoelectric materials are promising for energy harvesting using waste heat. The thermal management of the thermoelectric materials attract scientific and technological interests. The narrow bandgap semiconductor BiAgSe2 is a good candidate for thermoelectric materials due to its ultralow thermal conductivity. The mother compound BiAgSe2 crystallizes in hexagonal symmetry at room temperature, but experiences structural transitions to cubic phase at high temperature. By contrast, the daughter compound BiAgSeTe exhibits long range ordering and crystallizes into cubic phase at room temperature. Nevertheless, the local structural disorderings due to the Bi3+ and Ag+ anti-site defects, as well as local structural distortions, are ubiquitous in both parent BiAgSe2 and BiAgSeTe. BiAgSeTe exhibits distinct transport properties owing to the disordering-induced drastic changes in the electronic band structure, as well as the scattering dictated by the point defects. It is suggested that BiAgSe2 and BiAgSeTe could be good candidates for phonon glass and crystal glass (PGEC)-type thermoelectrics.
RESUMEN
A speckle-based method for the X-ray crystal diffraction wavefront measurement is implemented, and the slope errors of channel-cut crystals with different surface characteristics are measured. The method uses a speckle scanning technique generated by a scattering membrane translated using a piezo motor to infer the deflection of X-rays from the crystals. The method provides a high angular sensitivity of the channel-cut crystal slopes in both the tangential and sagittal directions. The experimental results show that the slope error of different cutting and etching processes ranges from 0.25 to 2.98 µrad. Furthermore, the results of wavefront deformation are brought into the beamline for simulation. This method opens up possibilities for new high-resolution applications for X-ray crystal diffraction wavefront measurement and provides feedback to crystal manufacturers to improve channel-cut fabrication.
RESUMEN
X-ray double-crystal monochromators face a shift of the exit beam when the Bragg angle and thus the transmitted photon energy changes. This can be compensated for by moving one or both crystals accordingly. In the case of monolithic channel-cut crystals, which exhibit utmost stability, the shift of the monochromated beam is inevitable. Here we report performance tests of novel, asymmetrically cut, channel-cut crystals which reduce the beam movements by more than a factor of 20 relative to the symmetric case over the typical energy range of an EXAFS spectrum at the Cu K-edge. In addition, the presented formulas for the beam offset including the asymmetry angle directly indicate the importance of this value, which has been commonly neglected so far in the operation of double-crystal monochromators.
RESUMEN
The sagittal-bent Laue monochromator can provide an ideal way to focus high-energy X-ray beams. However, the anticlastic curvature induced by sagittal bending has a great influence on the crystal performance. Thus, characterizing the bent-crystal shape is very important for predicting the performance of the bent-crystal monochromator. In this paper the crystal profile is measured by off-line optical metrology and on-line X-ray experiments. The off-line results showed that the bent-crystal surface could be well fitted to a saddle surface apart from a redundant cubic term which was related to the different couples applied on the crystal. On-line characterization of the meridional and the sagittal radius of the bent crystal includes double-crystal topography and ray-tracing measurement. In addition, the double-crystal topography experiment could be used as a quick diagnostic method for the bending condition adjustment. The sagittal radius of the bent crystal was characterized through a ray-tracing experiment by using a particularly designed tungsten mask. Moreover, rocking curves under different bending conditions were measured as well. The results were highly consistent with analytical results derived from the elastic theory. Furthermore, radii along different vertical positions under various bending conditions were measured and showed a quadratic relationship between the vertical positions and the meridional radii.