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1.
Ultramicroscopy ; 204: 91-100, 2019 Sep.
Artículo en Inglés | MEDLINE | ID: mdl-31132736

RESUMEN

Recent advancements in data mining methods in atom probe microscopy have enabled new quantitative chemical and microstructural characterization beyond the standard three-dimensional reconstruction. For example, spatial distribution maps have been developed to enable visualisation of the local lattice occupation of a selected region of interest. However, the precision of such studies yet remains unknown as correlation with complementary methods would be required. Therefore, a correlative study of atom probe microscopy, neutron diffraction and microstructural modelling of long-range ordered, nano-scale domains in a well-researched Fe-Co-Mo Maraging-type steel is presented here. Its microstructure consists of Mo-enriched µ-phase (Fe,Co)7Mo6 particles embedded into a body-centred cubic FeCo matrix. Previous research has shown that under slow cooling conditions, this matrix partially decomposes into nano-scale B2 long-range ordered domains surrounded by disordered regions, resulting in reduced toughness in potential cutting applications. Usually, a long-range order parameter S referring to ideal B2 long-range order is assumed within such domains according to neutron diffraction. However, atom probe microscopy and modelling results presented in the current study indicate lattice imperfections with a partial substitution of atoms on the Fe- and Co-sublattices. After considering preferential retention effects during the atom probe experiment, a model unit cell is presented to define the observed imperfect B2 long-range order as pseudo-D03 long-range order, and the potential impact on the materials properties is discussed.

2.
Ultramicroscopy ; 157: 12-20, 2015 Oct.
Artículo en Inglés | MEDLINE | ID: mdl-26000963

RESUMEN

Short-range-order (SRO) has been quantitatively evaluated in an Fe-18Al (at%) alloy using atom probe tomography (APT) data and by calculation of the generalised multicomponent short-range order (GM-SRO) parameters, which have been determined by shell-based analysis of the three-dimensional atomic positions. The accuracy of this method with respect to limited detector efficiency and spatial resolution is tested against simulated D03 ordered data. Whilst there is minimal adverse effect from limited atom probe instrument detector efficiency, the combination of this with imperfect spatial resolution has the effect of making the data appear more randomised. The value of lattice rectification of the experimental APT data prior to GM-SRO analysis is demonstrated through improved information sensitivity.

3.
Ultramicroscopy ; 150: 30-36, 2015 Mar.
Artículo en Inglés | MEDLINE | ID: mdl-25497494

RESUMEN

The analysis of the formation of clusters in solid solutions is one of the most common uses of atom probe tomography. Here, we present a method where we use the Voronoi tessellation of the solute atoms and its geometric dual, the Delaunay triangulation to test for spatial/chemical randomness of the solid solution as well as extracting the clusters themselves. We show how the parameters necessary for cluster extraction can be determined automatically, i.e. without user interaction, making it an ideal tool for the screening of datasets and the pre-filtering of structures for other spatial analysis techniques. Since the Voronoi volumes are closely related to atomic concentrations, the parameters resulting from this analysis can also be used for other concentration based methods such as iso-surfaces.

4.
Ultramicroscopy ; 111(6): 458-63, 2011 May.
Artículo en Inglés | MEDLINE | ID: mdl-21146305

RESUMEN

Whereas the atom probe is regarded almost exclusively as a technique for 3D chemical microanalysis of solids with the highest chemical and spatial resolution, we demonstrate that the technique can be used for detailed crystallographic determinations. We present a new method for the quantitative determination of crystal structure (plane spacings and angles) using a Hough transformation of the reconstructed atom probe data. The resolving power is shown to be high enough to identify poorly established, discontinuous planes that are typical in semiconducting materials. We demonstrate the determination of crystal geometry around a grain boundary and the use of the technique for the optimisation of tomographic reconstruction. We propose that this method will enable automatic spatial analysis and, ultimately, automated tomographic reconstruction in atom probe microscopy.

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